AMAT 3096-1000
Product Name
3096-1000 semiconductor wafer inspection system
Product Introduction
The AMAT 3096-1000 is an automated wafer inspection platform used in semiconductor fabs. It combines high-resolution imaging optics, illumination control, CCD acquisition and defect-analysis software to detect particles, scratches, pattern anomalies and other surface issues on wafers during incoming inspection, process control and yield management.











