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Yokogawa TS67PE-A Test System Module
Product Introduction: A high-performance module for the Yokogawa TS6700 series semiconductor test systems, providing advanced signal generation and measurement capabilities for integrated circuit (IC) testing.
Technical Specifications:
- Type: Test system module for TS6700 ATE
- Function: High-speed signal I/O, pattern generation, measurement
- Bandwidth: Up to 20 MHz
- Channels: Configurable multi-channel I/O
Detailed content
- Interface: GPIB, proprietary test bus
- Operating Temperature: 0°C to +50°C
- Power Supply: 24 V DC / 100–240 V AC
- Compliance: IEC60950-1, IEC61010 safety standards
Functional Features:
- High-speed digital signal generation and acquisition
- Multi-channel parallel testing for increased throughput
- Comprehensive ESD and over-voltage protection
- Advanced timing control for precise test sequencing
- Seamless integration with TS6700 mainframe and software
- Built-in self-diagnostic for fault detection
- Rugged construction for 24/7 industrial operation
Application Scenarios:
- Semiconductor IC functional and parametric testing
- Wafer-level and packaged device characterization
- Automotive electronics reliability testing
- Consumer electronics component validation
- Industrial microcontroller and ASIC testing
- R&D and production test environments
