Technical Specifications

• Channels:
  • 2 channels per module
• Bandwidth:
  • Analog Bandwidth: 1 GHz
• Sampling Rate:
  • Up to 5 GS/s (gigasamples per second) per channel
• Vertical Resolution:
  • 12 bits
• Vertical Range:
  • Voltage Range: ±100 mV to ±5 V (full-scale)
• Input Coupling:
  • AC and DC coupling options
• Input Impedance:
  • 50 Ω or 1 MΩ (selectable)
• Memory Depth:
  • Up to 512 MB (megabytes) per channel
• Triggering:
  • Advanced triggering capabilities including edge, pulse width, and complex conditions
• Timebase:
  • Adjustable with fine resolution for accurate timing control
• Connectivity:
  • PXIe interface for integration with other PXIe instruments

Functional Features

• High-Speed Sampling:
  • Supports sampling rates up to 5 GS/s per channel, allowing for precise capture and analysis of fast and transient signals.
• High Bandwidth:
  • Provides 1 GHz of analog bandwidth, enabling accurate measurement of high-frequency signals and complex waveforms.
• High Vertical Resolution:
  • 12-bit vertical resolution ensures detailed signal measurement and improved accuracy.
• Deep Memory:
  • Up to 512 MB of memory per channel facilitates extensive data capture and detailed signal analysis over extended periods or at high sampling rates.
• Advanced Triggering:
  • Offers sophisticated triggering capabilities to isolate specific signal events, including edge, pulse width, and complex triggering conditions, for precise data capture.
• Versatile Input Coupling:
  • Features both AC and DC coupling options to accommodate a variety of signal types and measurement needs.
• Software Integration:
  • Compatible with NI LabVIEW and other National Instruments software, enabling efficient programming, control, and comprehensive data analysis.

Application Scenarios

• High-Speed Signal Acquisition:
  • Ideal for capturing and analyzing high-speed and high-frequency signals in applications such as communications, electronics, and semiconductor testing.
• Automated Test Systems:
  • Suitable for use in automated test systems where high-speed, high-resolution signal acquisition is critical for production and quality control.
• Debugging and Validation:
  • Useful for debugging and validating electronic designs by capturing transient events and signal anomalies with precision.
• Research and Development:
  • Employed in research and development environments for analyzing high-speed signals and aiding in the development and validation of new technologies.
• Signal Integrity Testing:
  • Valuable for testing and ensuring the integrity of high-speed signal transmissions in electronic systems.
• Complex Signal Analysis:
  • Beneficial for scenarios requiring detailed analysis of complex signals, including precise timing and amplitude measurements.