Technical Specifications

• Channels:
  • 2 channels per module
• Bandwidth:
  • Analog Bandwidth: 1 GHz
• Sampling Rate:
  • Up to 5 GS/s (gigasamples per second) per channel
• Vertical Resolution:
  • 12 bits
• Vertical Range:
  • Voltage Range: ±100 mV to ±5 V (full-scale)
• Input Coupling:
  • AC and DC coupling options
• Input Impedance:
  • 50 Ω or 1 MΩ (selectable)
• Memory Depth:
  • Up to 512 MB (megabytes) per channel
• Triggering:
  • Advanced triggering capabilities, including edge, pulse width, and complex conditions
• Timebase:
  • Adjustable with fine resolution for precise timing control
• Connectivity:
  • PXIe interface for integration with other PXIe instruments

Functional Features

• High-Speed Sampling:
  • The PXIe-5170 supports high-speed sampling at up to 5 GS/s per channel, enabling accurate capture of fast and transient signals.
• High Bandwidth:
  • With a 1 GHz analog bandwidth, it can measure and analyze high-frequency signals, making it suitable for complex and demanding applications.
• High Vertical Resolution:
  • Offers 12-bit vertical resolution, providing finer signal detail and enhanced measurement accuracy.
• Deep Memory:
  • Equipped with up to 512 MB of memory per channel, supporting extensive data capture and detailed analysis over long time periods or at high sampling rates.
• Advanced Triggering:
  • Includes advanced triggering options to isolate specific signal events and conditions, ensuring precise and relevant data capture.
• Versatile Input Coupling:
  • Features both AC and DC coupling options to handle a wide range of signal types and measurement needs.
• Software Integration:
  • Fully compatible with NI LabVIEW and other National Instruments software platforms, enabling efficient programming, control, and analysis of data.

Application Scenarios

• High-Speed Signal Acquisition:
  • Ideal for applications that require capturing and analyzing high-speed and high-frequency signals, such as communications, electronics, and semiconductor testing.
• Automated Test Systems:
  • Suitable for integration into automated test systems where precise, high-speed signal acquisition is critical for production testing and quality assurance.
• Debugging and Validation:
  • Useful for debugging and validating electronic designs by capturing transient events and signal anomalies with high precision.
• Research and Development:
  • Employed in R&D environments to analyze high-speed signals, aiding in the development and validation of new technologies and designs.
• Signal Integrity Testing:
  • Valuable for testing and ensuring the integrity of high-speed signal transmissions in electronic systems, ensuring reliable performance.
• Complex Signal Analysis:
  • Beneficial for detailed analysis of complex signals, including precise timing and amplitude measurements.