Technical Specifications

• Channels:
  • 2 channels per module
• Bandwidth:
  • Analog Bandwidth: 1 GHz
• Sampling Rate:
  • Up to 5 GS/s (gigasamples per second) per channel
• Vertical Resolution:
  • 12 bits
• Vertical Range:
  • Voltage Range: ±100 mV to ±5 V (full-scale)
• Input Coupling:
  • AC and DC coupling options
• Input Impedance:
  • 50 Ω or 1 MΩ (selectable)
• Memory Depth:
  • Up to 1 GB (gigabyte) per channel
• Triggering:
  • Advanced triggering capabilities, including edge, pulse width, and complex conditions
• Timebase:
  • Adjustable with high resolution for accurate timing control
• Connectivity:
  • PXIe interface for seamless integration with other PXIe instruments

Functional Features

• High-Speed Sampling:
  • The PXIe-5163 provides high-speed sampling capabilities up to 5 GS/s per channel, allowing for the capture of fast and transient signals with high accuracy.
• High Bandwidth:
  • With 1 GHz of analog bandwidth, it can accurately measure and analyze high-frequency signals, making it suitable for complex signal analysis tasks.
• High Vertical Resolution:
  • The 12-bit vertical resolution offers improved detail and measurement accuracy for capturing fine signal characteristics.
• Deep Memory:
  • Offers up to 1 GB of memory per channel, which supports extensive data capture and detailed analysis of signals over long time periods or at high sampling rates.
• Advanced Triggering:
  • Features advanced triggering capabilities to isolate specific signal events, including edge, pulse width, and other complex conditions, which is crucial for precise data capture.
• Versatile Input Coupling:
  • Provides both AC and DC coupling options to accommodate a variety of signal types and measurement needs.
• Software Integration:
  • Compatible with NI LabVIEW and other National Instruments software, facilitating efficient programming, control, and comprehensive analysis of acquired data.

Application Scenarios

• High-Speed Signal Acquisition:
  • Ideal for capturing and analyzing high-speed and high-frequency signals in fields such as communications, electronics, and semiconductor testing.
• Automated Test Systems:
  • Suitable for use in automated test environments where high-speed, high-resolution signal acquisition is necessary for production testing and quality assurance.
• Debugging and Validation:
  • Useful for debugging and validating electronic designs by capturing transient events and signal anomalies with precision.
• Research and Development:
  • Employed in R&D environments to analyze high-speed signals, aiding in the development and testing of new technologies and designs.
• Signal Integrity Testing:
  • Valuable for assessing the integrity of high-speed signal transmissions in electronic systems, ensuring reliable performance.
• Complex Signal Analysis:
  • Beneficial for scenarios requiring detailed analysis of complex waveforms, including precise timing and amplitude measurements.