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NI PXIe-4080

The NI PXIe-4080 is a precision source measure unit (SMU) module from National Instruments, designed to provide high-performance electrical measurements and sourcing in a PXIe (PCI eXtensions for Instrumentation Express) chassis.

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Technical Specifications

  • Voltage Range:
    • Source: ±10 V
    • Measure: ±10 V
  • Current Range:
    • Source: ±1 A
    • Measure: ±1 A
  • Voltage Accuracy:
    • Source: ±0.02% of range
    • Measure: ±0.02% of range
  • Current Accuracy:
    • Source: ±0.02% of range
    • Measure: ±0.02% of range
  • Resolution:
    • Voltage Source Resolution: 24-bit
    • Current Source Resolution: 24-bit
    • Voltage Measurement Resolution: 24-bit
    • Current Measurement Resolution: 24-bit
  • Programming Rate:
    • Up to 200 kS/s (source and measure)
  • Compliance Limits:
    • Programmable limits for over-voltage and over-current protection
  • Channel Count:
    • Single channel
  • Connectivity:
    • PXIe interface for integration with other instruments in a PXIe system

Functional Features

  • Precision Measurement:
    • The PXIe-4080 provides high-accuracy voltage and current measurements with low noise and high resolution, ideal for precise testing and characterization.
  • Versatile Sourcing:
    • It can source precise voltage and current with programmable settings, making it suitable for a variety of applications where accurate sourcing is required.
  • Flexibility in Testing:
    • It supports various test configurations such as constant voltage, constant current, and a combination of both, allowing for versatile testing setups.
  • Advanced Calibration:
    • Includes advanced calibration features to ensure long-term accuracy and reliability.
  • Integrated Software:
    • Compatible with NI’s LabVIEW and NI-DMM (Digital Multimeter) drivers, facilitating seamless integration into automated test systems and simplifying programming.

Application Scenarios

  • Device Characterization:
    • Ideal for characterizing the electrical properties of electronic components, including resistors, capacitors, and semiconductor devices.
  • Battery Testing:
    • Suitable for testing and characterizing batteries by sourcing and measuring current and voltage under various conditions.
  • Automated Test Systems:
    • Commonly used in automated test systems for production and research environments due to its precision and integration capabilities.
  • Power Supply Testing:
    • Can be used to test power supplies by sourcing different voltages and measuring their responses under load.
  • Reliability Testing:
    • Useful for performing stress tests and reliability tests on electronic devices by applying various electrical stresses.

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