Technical Specifications:

• Number of Channels:
  • Digital Lines: 32
• I/O Type:
  • Bidirectional: Each line can be configured as either an input or an output.
• Digital I/O Voltage Levels:
  • Logic Levels: 0 V (low) to 5 V (high), TTL compatible
• Input Characteristics:
  • Input Logic Levels: 0 V to 5 V
  • Input Pull-Up/Pull-Down Resistors: Programmable per channel
• Output Characteristics:
  • Output Drive Capability: Typically 24 mA per line (source and sink)
  • Output Logic Levels: 0 V (low) to 5 V (high)
• Timing Specifications:
  • Update Rate: Up to 1 MHz (for static I/O operations)
• Isolation:
  • Channel-to-Channel Isolation: Not provided; uses common ground.
• Connector:
  • Type: 68-pin D-Sub (HD-68) connector
• Operating Temperature:
  • Temperature Range: 0°C to 55°C
• Storage Temperature:
  • Storage Range: -40°C to 70°C
• Relative Humidity:
  • Humidity Range: 10% to 90% non-condensing

Functional Features:

• High-Density Digital I/O: Provides 32 digital I/O lines, offering high-density connectivity for various digital signal processing tasks in a compact PXI module.
• Flexible I/O Configuration: Each digital line can be individually configured as an input or output, allowing for versatile signal handling and control.
• TTL Compatibility: Operates with standard TTL logic levels, making it suitable for a broad range of digital devices and circuits.
• Programmable Pull-Up/Pull-Down Resistors: Supports the customization of input lines to handle different signal conditions and requirements.
• High-Speed Operation: Capable of high-speed digital operations with an update rate of up to 1 MHz, making it suitable for real-time data acquisition and control applications.
• Driver and Software Support: Compatible with National Instruments’ software and drivers, including NI LabVIEW and NI MAX, enabling easy configuration and system integration.

Application Scenarios:

• Automated Test Systems: Ideal for use in automated test systems where high-density digital I/O is required for controlling and monitoring electronic devices.
• Digital Signal Processing: Useful for applications that involve handling multiple digital signals, such as in communication systems and electronic testing setups.
• Control Systems: Suitable for use in control systems where switching and controlling digital devices or circuits is necessary.
• Data Acquisition: Employed in data acquisition systems requiring robust digital I/O capabilities for capturing and generating digital signals.

Additional Considerations:

• Driver and Software Integration: Requires National Instruments’ drivers and software tools, such as NI LabVIEW or NI TestStand, for full functionality and integration into test systems.
• Connector and Wiring: Uses a 68-pin D-Sub connector for interfacing with external equipment. Proper wiring and signal conditioning may be required to ensure accurate signal handling.