Technical Specifications:

• Number of Channels:
  • Digital Lines: 96
• I/O Type:
  • Bidirectional: Can be configured as input or output for each line.
• Digital I/O Voltage Levels:
  • TTL Compatible: 0 V (low) to 5 V (high)
  • Logic Threshold: Typically around 2.5 V (adjustable if needed)
• Input Characteristics:
  • Input Logic Levels: 0 V to 5 V
  • Input Pull-Up/Pull-Down Resistors: Programmable
• Output Characteristics:
  • Output Drive Capability: Typically 24 mA per line (source and sink)
  • Output Logic Levels: 0 V (low) to 5 V (high)
• Timing Specifications:
  • Update Rate: Up to 1 MHz (for static I/O operations)
• Isolation:
  • Channel-to-Channel Isolation: Not provided; uses common ground.
• Connector:
  • Type: 96-pin D-Sub (HD-96) connector
• Operating Temperature:
  • Temperature Range: 0°C to 55°C
• Storage Temperature:
  • Storage Range: -40°C to 70°C
• Relative Humidity:
  • Humidity Range: 10% to 90% non-condensing

Functional Features:

• High-Density Digital I/O: Provides 96 digital I/O lines in a compact form factor, offering high-density connectivity for digital signal processing.
• Flexible I/O Configuration: Each digital line can be individually configured as an input or output, allowing for versatile signal handling.
• TTL Compatibility: Operates with standard TTL logic levels, making it compatible with a wide range of digital devices and circuits.
• Programmable Pull-Up/Pull-Down Resistors: Allows for customization of input lines to handle various signal conditions.
• High-Speed Operation: Supports high-speed digital operations with an update rate of up to 1 MHz, suitable for real-time data acquisition and control.
• Driver and Software Support: Compatible with National Instruments’ software and drivers, such as NI LabVIEW and NI MAX, for easy configuration and control.

Application Scenarios:

• Automated Test Systems: Ideal for use in automated test environments where high-density digital I/O is required for controlling and monitoring devices.
• Digital Signal Processing: Suitable for applications that require handling a large number of digital signals, such as in digital communication systems and electronic testing.
• Control Systems: Used in control systems for switching and controlling various digital devices or circuits.
• Data Acquisition: Employed in data acquisition systems where digital I/O is needed for capturing and generating digital signals.

Additional Considerations:

• Driver and Software Integration: Requires National Instruments’ drivers and software, such as NI LabVIEW or NI TestStand, for full functionality and integration into test systems.
• Connector and Wiring: Utilizes a 96-pin D-Sub connector for interfacing with external equipment. Proper wiring and signal conditioning may be necessary for accurate signal handling.