AMAT 0050-32172
Product Name: CMP Polishing Pad and Retaining Ring Kit
Product Introduction:
This kit includes consumable components for Applied Materials’ Mirra or Reflexion Chemical Mechanical Planarization (CMP) systems. The kit typically consists of a polyurethane polishing pad (often with a fixed-abrasive or slurry-based surface) and a retaining ring made of a composite material. The pad provides the mechanical abrasion while the retaining ring holds the wafer against the pad to ensure uniform material removal across the entire wafer surface.
Detailed content
Technical Specifications:
- Pad Material: Polyurethane with specific hardness (Shore D 50-70), compressibility, and groove patterns (spiral or concentric).
- Retaining Ring Material: Phenolic resin or polymer composite with high wear resistance.
- Pad Dimensions: Standard 20-inch or 24-inch diameter platen compatibility.
- Slurry Compatibility: Designed for oxide, metal (Cu/W), or slurry-specific chemistries.
- Life Expectancy: Measured in number of wafers polished (typically 50-200 wafers depending on the material being removed).
Functional Features:
- Global Planarization: Capable of removing topography to create a perfectly flat surface for subsequent lithography layers.
- Material Selectivity: Pad chemistry is tuned to remove specific materials (e.g., oxide) while stopping on others (e.g., silicon nitride) with high selectivity.
- Defect Reduction: Advanced pad conditioning (diamond dresser) integration maintains pad roughness and prevents glazing.
- Wafer Retention: The retaining ring applies controlled down-force to prevent wafer edge lift-off, ensuring edge-to-edge uniformity.
- Slurry Distribution: Pad grooves are engineered to transport slurry efficiently across the wafer interface.
Application Scenarios:
- Shallow Trench Isolation (STI): Planarizing oxide fill in isolation trenches.
- Inter-Layer Dielectric (ILD): Smoothing layers between metal interconnects.
- Copper Damascene: Removing excess copper (overburden) after electroplating and stopping at the barrier layer.
- Tungsten Plug: Polishing back tungsten used for vertical interconnects (vias/contacts).
- Advanced Packaging: Thinning wafers for 3D stacking and TSV reveal.






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