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AMAT 0050-25949

Product Name: Chamber View Port / Optical Window
Product Introduction: A transparent assembly installed in the chamber wall or lid to allow visual inspection, optical pyrometry, or laser-based diagnostics to monitor the process inside the vacuum chamber.
Technical Specifications:

  • Window Material: Fused Silica (Quartz), Sapphire, or Borosilicate Glass.

Detailed content

  • Thickness: 5mm to 20mm (dependent on pressure differential).
  • AR Coating: Anti-Reflective coating for specific wavelengths (e.g., 633nm for HeNe lasers).
  • Viewing Angle: 0° (straight through) or 45° (angled for side view).
  • Pressure Rating: Full vacuum to 15 PSI positive pressure.
    Functional Features:
  • Plasma Viewing: Allows cameras to see wafer color and plasma uniformity.
  • Optical Access: Provides a path for interferometry, ellipsometry, or pyrometry lasers.
  • Deposition Shield: Often includes a ring of gas or a shutter mechanism to blow clean gas across the window to prevent coating.
  • UV Transmission: High transmission quartz for UV-based endpoint detection.
    Application Scenarios:
  • Endpoint Detection: Optical sensors look for color changes in the plasma or on the wafer to stop the etch process.
  • Pyrometry: Measures wafer temperature through the window without physical contact.
  • Preventive Maintenance: Allows operators to visually check for arcing, sputtering on shields, or wafer breakage.
  • In-Situ Metrology: Used for real-time thickness monitoring during deposition.

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