AMAT 0020-78186
Product Name: Electrostatic Chuck (ESC) with Heater and Gas Channel Assembly
Product Introduction:
This is a core consumable/component for Applied Materials’ Producer, Centura, and Endura platforms. The Electrostatic Chuck (ESC) is the “platform” inside the vacuum chamber where the wafer sits. It uses high-voltage electrostatic force (Johnsen-Rahbek effect) to clamp the wafer firmly in place. It also incorporates a backside helium cooling system, resistive heaters for wafer temperature control, and often lift pins for wafer transfer.
Technical Specifications:
- Clamping Voltage: High voltage DC (typically 500V to 2000V) applied via a dielectric layer.
Detailed content
- Temperature Range: Capable of heating wafers from -20°C (with LN2 assist) up to 600°C+.
- Helium Pressure: Backside helium cooling channels operate at 5-20 Torr for efficient heat transfer.
- Dielectric Material: Aluminum Nitride (AlN) or Alumina (Al2O3) with high thermal conductivity and dielectric strength.1.
- Lift Pin Mechanism: Integrated pneumatic or magnetic lift pins (3-5 pins) to elevate the wafer for robot hand-off.
Functional Features:
- Wafer Clamping: Provides uniform clamping force across the wafer to prevent movement during high-energy plasma processing.
- Thermal Control: Precise temperature control (±1°C) is critical for process repeatability (e.g., CVD deposition rates, etch selectivity).
- Heat Transfer: Backside helium gas fills the microscopic gap between wafer and chuck for efficient heat removal during exothermic processes.
- Edge Ring: Often includes a focus ring or edge ring to confine plasma and protect the chuck edge from deposition/etch.
- RF Bias: In etch systems, the ESC often acts as the RF bias electrode to control ion energy direction.
Application Scenarios:
- High-Power PVD: Holding wafers during high-power sputtering where thermal loads are significant.
- Plasma Etch: Biasing the wafer to attract ions vertically for anisotropic etching.1.
- CVD/PECVD: Maintaining precise wafer temperature to control film stress, density, and stoichiometry.
- Rapid Thermal Processing (RTP): Used in anneal tools for rapid heating and cooling cycles.
- Ion Implantation: Holding wafers during high-current ion beams.









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